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<ArticleSet>
<Article>
<Journal>
				<PublisherName>Semnan University Press</PublisherName>
				<JournalTitle>Journal of Modeling in Engineering</JournalTitle>
				<Issn>2008-4854</Issn>
				<Volume>15</Volume>
				<Issue>50</Issue>
				<PubDate PubStatus="epublish">
					<Year>2017</Year>
					<Month>09</Month>
					<Day>23</Day>
				</PubDate>
			</Journal>
<ArticleTitle>Modeling and Simulation Buckling Behavior of Silicon  and  Nanowires Using the Structural Mechanics Approach Method</ArticleTitle>
<VernacularTitle>Modeling and Simulation Buckling Behavior of Silicon &lt;100&gt; and &lt;111&gt; Nanowires Using the Structural Mechanics Approach Method</VernacularTitle>
			<FirstPage>85</FirstPage>
			<LastPage>93</LastPage>
			<ELocationID EIdType="pii">2553</ELocationID>
			
<ELocationID EIdType="doi">10.22075/jme.2017.2553</ELocationID>
			
			<Language>FA</Language>
<AuthorList>
<Author>
					<FirstName>Amin</FirstName>
					<LastName>Yasini</LastName>
<Affiliation></Affiliation>

</Author>
</AuthorList>
				<PublicationType>Journal Article</PublicationType>
			<History>
				<PubDate PubStatus="received">
					<Year>2012</Year>
					<Month>10</Month>
					<Day>15</Day>
				</PubDate>
			</History>
		<Abstract>In this research, Si and nanowires with different lengths between 0.5 to 20 nm and thicknesses between 1 to 4 nm, are investigated by using structural mechanics approach and numerical method by ABAQUS software. DREIDING force field is used for force field. In this analysis critical buckling load are calculated. The results of this study show that critical load in ratio of the length of the nanowire thickness less than 10 will be diverted from the Euler equation. The same thickness and length, Si nanowires had the maximum critical buckling load. this method in comparison of other than methods such as molecular dynamics has higher analyzing speed and suitable accuracy.</Abstract>
			<OtherAbstract Language="FA">In this research, Si and nanowires with different lengths between 0.5 to 20 nm and thicknesses between 1 to 4 nm, are investigated by using structural mechanics approach and numerical method by ABAQUS software. DREIDING force field is used for force field. In this analysis critical buckling load are calculated. The results of this study show that critical load in ratio of the length of the nanowire thickness less than 10 will be diverted from the Euler equation. The same thickness and length, Si nanowires had the maximum critical buckling load. this method in comparison of other than methods such as molecular dynamics has higher analyzing speed and suitable accuracy.</OtherAbstract>
		<ObjectList>
			<Object Type="keyword">
			<Param Name="value">Silicon nanowires</Param>
			</Object>
			<Object Type="keyword">
			<Param Name="value">Young&amp;#039;s module</Param>
			</Object>
			<Object Type="keyword">
			<Param Name="value">Critical buckling load</Param>
			</Object>
			<Object Type="keyword">
			<Param Name="value">Mechanics Approach Method</Param>
			</Object>
		</ObjectList>
<ArchiveCopySource DocType="pdf">https://modelling.semnan.ac.ir/article_2553_51da8c852fe8188542ed79cc2546794e.pdf</ArchiveCopySource>
</Article>
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