Identification and Diagnosis of Power Semiconductor Switches Open-Circuit Failure in Neutral Point Clamped Multilevel Inverter

Document Type : Power Article

Authors

Faculty of Electrical and Computer Engineering, Urmia University, Urmia, Iran

Abstract

This article presents the open switch fault detection and diagnosis of neutral point clamped inverters using neural networks. The neutral point clamped inverter consist of four power semiconductor switches with two clamp diodes in each phase. As the number of power semiconductor switches in the inverter increases, the probability of fault occurrence significantly increases. Therefore, for ensuring uninterrupted operation and preventing additional damage during faults, rapid fault diagnosis is essential for the fault tolerant systems. In this study, a neural network based system is developed for the detection and diagnosis of open switch faults in one or two power semiconductor switches in neutral point clamped inverter. The proposed method relies on measuring the inverter output currents and calculating their average values, which are then used for training the neural network. The proposed system covers open switch fault diagnosis for one or two switches. The mentioned system was simulated in the MATLAB/SIMULINK environment, and the result demonstrate accuracy and rapid fault diagnosis for semiconductor power switches within a fundamental cycle.

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References

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Journal of Modeling in Engineering
Volume 23, Issue 80
In Progress
March 2025
Pages 95-109

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History

  • Receive Date: 22 December 2023
  • Revise Date: 20 May 2024
  • Accept Date: 11 June 2024

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